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Results 1-10 of 13 (Search time: 0.008 seconds).
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PreviewIssue DateTitleAuthor(s)
2016Exploiting temporal information for DCNN-based fine-grained object classificationGe, Z.; McCool, C.; Sanderson, C.; Wang, P.; Liu, L.; Reid, I.; Corke, P.; International Conference on Digital Image Computing: Techniques and Applications (DICTA 2016) (30 Nov 2016 - 02 Dec 2016 : Gold Coast, AUSTRALIA)
2016Geometrically consistent plane extraction for dense indoor 3D maps segmentationPham, T.; Eich, M.; Reid, I.; Wyeth, G.; IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2016) (09 Oct 2016 - 14 Oct 2016 : Daejeon, SOUTH KOREA)
2016Measuring the performance of single image depth estimation methodsCadena, C.; Latif, Y.; Reid, I.; 2016 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2016) (09 Oct 2016 - 14 Oct 2016 : Daejeon, South Korea)
2016Learning local image descriptors with deep siamese and triplet convolutional networks by minimizing global loss functionsVijay Kumar, B.; Carneiro, G.; Reid, I.; 29th IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2016) (26 Jun 2016 - 01 Jul 2016 : Las Vegas, NV)
2016Unsupervised CNN for single view depth estimation: geometry to the rescueGarg, R.; Vijay Kumar, B.; Carneiro, G.; Reid, I.; 14th European Conference on Computer Vision (ECCV 2016) (11 Oct 2016 - 14 Oct 2016 : Amsterdam, Netherlands)
2016Exploring context with deep structured models for semantic segmentationLin, G.; Shen, C.; Hengel, A.; Reid, I.
2016Fast training of triplet-based deep binary embedding networksZhuang, B.; Lin, G.; Shen, C.; Reid, I.; Computer Society Conference on Computer Vision and Pattern Recognition (CVPRW) (27 Jun 2016 - 30 Jun 2016 : Las Vegas, NV)
2016Learning depth from single monocular images using deep convolutional neural fieldsLiu, F.; Shen, C.; Lin, G.; Reid, I.
2016Efficient piecewise training of deep structured models for semantic segmentationLin, G.; Shen, C.; Van Den Hengel, A.; Reid, I.; 29th IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2016) (26 Jun 2016 - 01 Jul 2016 : Las Vegas, NV)
2016Efficient point process inference for large-scale object detectionPham, T.; Rezatofighi, S.; Reid, I.; Chin, T.; 29th IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2016) (26 Jun 2016 - 01 Jul 2016 : Las Vegas, NV)