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Results 11-20 of 58 (Search time: 0.002 seconds).
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PreviewIssue DateTitleAuthor(s)
2002Results of A/D converter compensation with a VLSI chipTsimbinos, J.; Marwood, W.; BeaumontSmith, A.; Lim, C.; White, P.; Information, Decision and Control (2002 : Adelaide, South Australia)
2002Automation human skin segmentation based on color information in the YCbCr color spaceHabili, N.; Lim, C.; Moini, A.; White, P.; Information, Decision and Control (2002 : Adelaide, South Australia)
2001Dual v-support vector machine with error rate and training size biasingChew, H.; Bogner, R.; Lim, C.; John Matthews, V.; IEEE International Conference on Acoustics, Speech and Signal Processing (2001 : Salt Lake City, Utah)
2005Verifying system-on-chips at the software application levelCheng, A.; Parashkevov, A.; Lim, C.; Osseiran, A.; Lachowicz, S.; Reis, R.; Pfleiderer, H.; Kang, S.; International Conference on Very Large Scale Integration System-on-Chip (2005 : Perth, Western Australia)
2001On initialising nu-Support Vector Machine TrainingChew, H.; Lim, C.; Bogner, R.; Li, D.; International Conference on Optimization: Techniques and Applications (5th : 2001 : Hong Kong)
2003Video object plane extraction for sign language video sequencesHabili, N.; Lim, C.; Moini, A.; Liu, X.; International DCDIS Conference on Engineering Applications (3rd : 2003 : Guelph, Ontario, Canada)
2007A mentoring scheme for international masters studentsLim, C.; Crisp, P.; Hicks, A.; Higher Education Research and Development Society of Australasia Conference (30th : 2007 : Adelaide, S.A.)
2008Using genetic evolutionary software application testing to verify a DSP SoCCheng, A.; Lim, C.; Sun, Y.; He, H.; Zhou, Z.; Lei, T.; Osseiran, A.; IEEE International Symposium on Electronic Design (4th : 2008 : Hong Kong)
2006Analysis and optimization of attribute combinations coverage for SoC testingCheng, A.; Lim, C.; Parashkevov, A.; Hang Guen Jeong,; International SoC Design Conference (26 Oct 2006 : Seoul, Korea)
2006Coverage measurement for software application testing using partially ordered domains and symbolic trajectory evaluation techniquesCheng, A.; Parashkevov, A.; Lim, C.; Girard, P.; Osseiran, A.; Chew, M.; IEEE International Workshop on Electronic Design, Test and Applications (3rd : 2006 : Kuala Lumpur, Malaysia)