Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/112426
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dc.contributor.authorZhang, L.-
dc.contributor.authorBasak, A.-
dc.date.issued2013-
dc.identifier.citationPhilosophical Magazine Letters: structure and properties of condensed matter, 2013; 93(8):448-456-
dc.identifier.issn0950-0839-
dc.identifier.issn1362-3036-
dc.identifier.urihttp://hdl.handle.net/2440/112426-
dc.description.abstractThis paper establishes the first quantitative relationship between the phases transformed in silicon and the shape characteristics of nanoindentation curves. Based on an integrated analysis using TEM and unit cell properties of phases, the volumes of the phases emerged in a nanoindentation are formulated as a function of pop-out size and depth of nanoindentation impression. This simple formula enables a fast, accurate and quantitative prediction of the phases in a nanoindentation cycle, which has been impossible before.-
dc.description.statementofresponsibilityLiangchi Zhang and Animesh Basak-
dc.language.isoen-
dc.publisherTaylor & Francis-
dc.rights© 2013 Taylor & Francis-
dc.source.urihttp://dx.doi.org/10.1080/09500839.2013.798441-
dc.subjectPhase transformation; silicon; quantitative prediction; nanoindentation-
dc.titleQuantitative prediction of phase transformations in silicon during nanoindentation-
dc.typeJournal article-
dc.identifier.doi10.1080/09500839.2013.798441-
dc.relation.grantARC-
pubs.publication-statusPublished-
dc.identifier.orcidBasak, A. [0000-0003-2301-4758]-
Appears in Collections:Adelaide Microscopy publications
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