Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/126302
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Type: | Conference paper |
Title: | Convergence properties of surface conductivity characterization method for thin conductive strips |
Author: | Shahpari, M. Fumeaux, C. Thiel, D. |
Citation: | Proceedings of the 4th Australian Microwave Symposium (AMS 2020), 2020, pp.1-2 |
Publisher: | IEEE |
Publisher Place: | Piscataway, NJ |
Issue Date: | 2020 |
ISBN: | 9781728110509 |
Conference Name: | Australian Microwave Symposium (AMS) (13 Feb 2020 - 14 Feb 2020 : Sydney, Australia) |
Statement of Responsibility: | Morteza Shahpari, Christophe Fumeaux and David V. Thiel |
Abstract: | A new method to measure the surface conductivity σs of thin conductors has been recently proposed, that requires placement of a narrow strip inside a rectangular waveguide. Infinite series appear in the calculations required to extract σ s from the measured scattering parameters. In this paper, we explore the convergence of the different series that are associated with two choices of basis functions (uniform & cosh). We also show the impact of the series truncation on the final computed values of the complex surface conductivity of 10- j 10mS=Sq at 10GHz. |
Keywords: | Surface conductivity; surface resistivity; measurement methods; convergent series; convergence error |
Rights: | © 2020 IEEE. |
DOI: | 10.1109/AMS48904.2020.9059362 |
Published version: | https://ieeexplore.ieee.org/xpl/conhome/9046188/proceeding |
Appears in Collections: | Aurora harvest 8 Electrical and Electronic Engineering publications |
Files in This Item:
File | Description | Size | Format | |
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hdl_126302.pdf | Accepted version | 885.08 kB | Adobe PDF | View/Open |
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