Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/13738
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dc.contributor.authorZhou, B.en
dc.contributor.authorGreenhalgh, S.en
dc.date.issued2002en
dc.identifier.citationGeophysics, 2002; 67(3):755-765en
dc.identifier.issn0016-8033en
dc.identifier.issn1942-2156en
dc.identifier.urihttp://hdl.handle.net/2440/13738-
dc.descriptionCopyright © 2002 Society of Exploration Geophysicistsen
dc.description.statementofresponsibilityBing Zhou and Stewart A. Greenhalghen
dc.language.isoenen
dc.publisherSoc Exploration Geophysicistsen
dc.source.urihttp://segdl.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=GPYSA7000067000003000755000001&idtype=cvipsen
dc.titleRapid 2-D/3-D crosshole resistivity imaging using the analytic sensitivity functionen
dc.typeJournal articleen
dc.identifier.rmid0020020756en
dc.identifier.doi10.1190/1.1484518en
dc.identifier.pubid60184-
pubs.library.collectionGeology & Geophysics publicationsen
pubs.verification-statusVerifieden
pubs.publication-statusPublisheden
Appears in Collections:Geology & Geophysics publications

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