Adelaide Research & Scholarship
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| Type: | Conference paper |
| Title: | THz near-field microscopy - A review |
| Author: | Lin, H. Fischer, B. Mickan, S. Abbott, D. |
| Citation: | Joint 31st International Conference on Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006 / p. 441. |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers |
| Issue Date: | 2006 |
| ISBN: | 1424404002 9781424404001 |
| Conference Name: | International Conference on Infrared and Millimeter Waves (31st : 2006 : Shanghai, China) |
| Editor: | Shen, X.C. Lu, W. Zhang, J. Dou, W.B. |
| Statement of Responsibility: | Lin, Hungyen ; Fischer, Bernd M. ; Mickan, Samuel P. ; Abbott, Derek |
| Abstract: | One of the major limitations of THz imaging is low spatial resolution. Consequently, various techniques have been proposed in the literature to break the diffraction limit. Many of the existing techniques draw inspiration from near-field scanning optical microscopy, while other techniques tightly focus optical beams to reduce the size of the generated THz beams. This paper reviews briefly the existing THz near-field methods and recent developments for identifying possible areas of research potential. |
| Rights: | © 2006 IEEE |
| DOI: | 10.1109/ICIMW.2006.368649 |
| Published version: | http://dx.doi.org/10.1109/icimw.2006.368649 |
| Appears in Collections: | Aurora harvest 6 Electrical and Electronic Engineering publications |
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