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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/46792
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dc.contributor.authorWithayachumnankul, W.-
dc.contributor.authorFischer, B.-
dc.contributor.authorAbbott, D.-
dc.date.issued2008-
dc.identifier.citationOptics Communications, 2008; 281(9):2374-2379-
dc.identifier.issn0030-4018-
dc.identifier.urihttp://hdl.handle.net/2440/46792-
dc.descriptionCopyright © 2008 Elsevier B.V. All rights reserved.-
dc.description.abstractThis work presents a multilayer interference filter, suitable for operation with terahertz waves (T-rays). An analysis of the effect of the number of layers on the spectral response is given, with full measurement data including time-resolved signals, transmittances, and phase spectra. The silicon-air structure with a submillimeter thickness shows a stop-band between 0.2 and 0.5 THz, and the attenuation inside the stop-band increases in proportion to the number of layers in the structure. The measurement of the fabricated structure is in agreement with a characteristic matrix analysis. © 2008 Elsevier B.V. All rights reserved.-
dc.description.statementofresponsibilityWithawat Withayachumnankul, Bernd M. Fischer and Derek Abbott-
dc.description.urihttp://www.elsevier.com/wps/find/journaldescription.cws_home/505711/description#description-
dc.language.isoen-
dc.publisherElsevier Science BV-
dc.source.urihttp://dx.doi.org/10.1016/j.optcom.2007.12.094-
dc.titleQuarter-wavelength multilayer interference filter for terahertz waves-
dc.typeJournal article-
dc.identifier.doi10.1016/j.optcom.2007.12.094-
pubs.publication-statusPublished-
dc.identifier.orcidWithayachumnankul, W. [0000-0003-1155-567X]-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest 6
Electrical and Electronic Engineering publications

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