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https://hdl.handle.net/2440/50915
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Type: | Conference paper |
Title: | Optimization of material thickness for THz-TDS |
Author: | Withayachumnankul, W. Fischer, B. Abbott, D. |
Citation: | Proceedings of 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves : pp.1-2 |
Publisher: | IEEE |
Publisher Place: | CD |
Issue Date: | 2008 |
ISBN: | 9781424421190 |
Conference Name: | IRMMW - THz 2008 (2008 : Pasadena, California) |
Statement of Responsibility: | Withawat Withayachumnankul, Bernd M. Fischer and Derek Abbott |
Abstract: | How thick should a sample be for a transmission-mode THz-TDS measurement? Should a sample be as thick as possible? The answer is 'no'. Although greater thickness allows T-rays to interact more with bulk material, the SNR rolls off with thickness due to signal attenuation. So, should a sample be extremely thin? Again, the answer is 'no'. A sample that is too thin renders itself nearly invisible to T-rays, in such a way that the system can hardly sense the difference between the sample and a free space path. Hence, where is the optimal boundary between 'too thick' and 'too thin'? The analytical expression to find the optimum thickness is revealed in this paper. This optimality results in the minimal uncertainty of measured optical constants. The derived model for optimal thickness is supported by the results from experiments performed with polyvinyl chloride (PVC) and other materials. ©IEEE. |
Keywords: | Extinction coefficients polymers refractive index terahertz wave spectra time-domain analysis |
Description: | © Copyright 2009 IEEE – All Rights Reserved |
DOI: | 10.1109/ICIMW.2008.4665677 |
Description (link): | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4665677 |
Published version: | http://dx.doi.org/10.1109/icimw.2008.4665677 |
Appears in Collections: | Aurora harvest 5 Electrical and Electronic Engineering publications |
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