Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/54959
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Type: Journal article
Title: Direct measurement of absorption-induced wavefront distortion in high optical power systems
Author: Brooks, A.
Hosken, D.
Munch, J.
Veitch, P.
Yan, Z.
Zhao, C.
Fan, Y.
Ju, L.
Blair, D.
Willems, P.
Slagmolen, B.
Degallaix, J.
Citation: Applied Optics, 2009; 48(2):355-364
Publisher: Optical Society of America
Issue Date: 2009
ISSN: 1559-128X
0003-6935
Statement of
Responsibility: 
Aidan F. Brooks, David Hosken, Jesper Munch, Peter J. Veitch, Zewu Yan, Chunnong Zhao, Yaohui Fan, Li Ju, David Blair, Phil Willems, Bram Slagmolen, and Jerome Degallaix
Abstract: Wavefront distortion due to absorption in the substrates and coatings of mirrors in advanced gravitational wave interferometers has the potential to compromise the operation and sensitivity of these interferometers [Opt. Lett.29, 2635-2637 (2004)]. We report the first direct spatially-resolved measurement, to our knowledge, of such wavefront distortion in a high optical power cavity. The measurement was made using an ultrahigh sensitivity Hartmann wavefront sensor on a dedicated test facility. The sensitivity of the sensor was lambda/730, where lambda=800 nm.
Rights: Copyright © 2009 Optical Society of America
RMID: 0020090127
DOI: 10.1364/AO.48.000355
Appears in Collections:Physics publications
Environment Institute publications

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