Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/55058
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dc.contributor.authorWithayachumnankul, W.en
dc.contributor.authorUng, B.en
dc.contributor.authorFischer, B.en
dc.contributor.authorAbbott, D.en
dc.date.issued2009en
dc.identifier.citationProceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp.1-2en
dc.identifier.isbn9781424454174en
dc.identifier.urihttp://hdl.handle.net/2440/55058-
dc.description.abstractThis article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.en
dc.description.statementofresponsibilityWithayachumnankul, W.; Ung, B.S.-Y.; Fischer, B.M. and Abbott, D.;en
dc.language.isoenen
dc.publisherIEEEen
dc.titleMeasurement of linearity in THz-TDSen
dc.typeConference paperen
dc.identifier.rmid0020093260en
dc.contributor.conferenceIRMMW - THz 2009 (34th : 2009 : Korea)en
dc.identifier.doi10.1109/ICIMW.2009.5324721en
dc.publisher.placeCDen
dc.identifier.pubid37143-
pubs.library.collectionElectrical and Electronic Engineering publicationsen
pubs.verification-statusVerifieden
pubs.publication-statusPublisheden
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]en
Appears in Collections:Electrical and Electronic Engineering publications

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