Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/56574
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dc.contributor.authorChen, Peien
dc.contributor.authorSuter, Daviden
dc.date.issued2003en
dc.identifier.urihttp://hdl.handle.net/2440/56574-
dc.description.abstractIllumination effects, including shadows and varying lighting, makes the problem of face recognition challenging. Experimental and theoretical results show that the face images under different illumination conditions lie in a low-dimensional subspace, hence principal component analysis (PCA) or low-dimensional subspace techniques have been used. Following this spirit, we propose new techniques for the face recognition problem, including an outlier detection strategy (mainly for those points not following the Lambertian reflectance model), and a new Bayesian-based error criterion for the recognition algorithm. Experiments using the Yale-B face database show the effectiveness of the new strategiesen
dc.description.statementofresponsibilityPei Chen and David Suteren
dc.language.isoenen
dc.publisherMonash Universityen
dc.relation.ispartofseriesTechnical report ; MECSE-5-2003en
dc.source.urihttp://www.ecse.monash.edu.au/techrep/reports/en
dc.subjectFace recognition; Linear subspace;Principal component analysis; Illuminationeffecten
dc.titleSubspace-based face recognition: outlier detection and a new distance criterionen
dc.typeReporten
dc.contributor.schoolSchool of Computer Scienceen
dc.identifier.rmid0020094196en
Appears in Collections:Computer Science publications

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