Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/71539
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Type: Conference paper
Title: Next step in terahertz multiple scattering modeling: the strongly diffusing structures
Author: De Dobbeleer, D.
Fischer, B.
Vandewal, M.
Citation: Proceedings of the 36th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THZ), held in Houston, Texas, 2-7 October, 2011: pp.1-2
Publisher: IEEE
Publisher Place: USA
Issue Date: 2011
ISBN: 9781457705083
Conference Name: International Conference on Infrared, Millimeter and Terahertz Waves (36th : 2011 : Houston, Texas)
Statement of
Responsibility: 
David M. De Dobbeleer, Bernd M. Fischer and Marijke Vandewal
Abstract: Recently, different approaches to remove artifacts arising from multiple-scattering imprinted THz-TDS data were proposed. We sketch the way ahead for a new fundamental study of the diffusive T-rays, reconsidering the main scattering-related theoretical results and pointing out the limits of existing artifactsremoving experimental methods.
Rights: © 2011 IEEE
RMID: 0020119041
DOI: 10.1109/irmmw-THz.2011.6104850
Appears in Collections:Electrical and Electronic Engineering publications

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