Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/71539
Citations | ||
Scopus | Web of Science® | Altmetric |
---|---|---|
?
|
?
|
Type: | Conference paper |
Title: | Next step in terahertz multiple scattering modeling: the strongly diffusing structures |
Author: | De Dobbeleer, D. Fischer, B. Vandewal, M. |
Citation: | Proceedings of the 36th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THZ), held in Houston, Texas, 2-7 October, 2011: pp.1-2 |
Publisher: | IEEE |
Publisher Place: | USA |
Issue Date: | 2011 |
ISBN: | 9781457705083 |
Conference Name: | International Conference on Infrared, Millimeter and Terahertz Waves (36th : 2011 : Houston, Texas) |
Statement of Responsibility: | David M. De Dobbeleer, Bernd M. Fischer and Marijke Vandewal |
Abstract: | Recently, different approaches to remove artifacts arising from multiple-scattering imprinted THz-TDS data were proposed. We sketch the way ahead for a new fundamental study of the diffusive T-rays, reconsidering the main scattering-related theoretical results and pointing out the limits of existing artifactsremoving experimental methods. |
Rights: | © 2011 IEEE |
DOI: | 10.1109/irmmw-THz.2011.6104850 |
Published version: | http://dx.doi.org/10.1109/irmmw-thz.2011.6104850 |
Appears in Collections: | Aurora harvest Electrical and Electronic Engineering publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.