Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/83819
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Type: Conference paper
Title: An automated system for emulated network experimentation
Author: Knight, S.
Nguyen, H.
Maennel, O.
Phillips, I.
Falkner, N.
Bush, R.
Roughan, M.
Citation: Proceedings of the 9th International Conference on Emerging Networking Experiments and Technologies, CoNEXT 2013, 2013 / pp.235-246
Publisher: Association for Computing Machinery
Publisher Place: USA
Issue Date: 2013
ISBN: 9781450321013
Conference Name: International Conference on Emerging Networking Experiments and Technologies (9th : 2014 : Santa Barbara, USA)
Statement of
Responsibility: 
Simon Knight, Hung Nguyen, Olaf Maennel, Iain Phillips, Nickolas Falkner, Randy Bush, Matthew Roughan
Abstract: Emulated networks and systems, where router and server software are run in virtual environments, allow network operators and researchers to perform experiments at large scale more economically than in testbeds. Running real code provides a greater level of realism than simulation. However, large scale comes with a problem: running real software means each test needs at least as much configuration as a real network. To recognise the true value of emulation at scale, we need to reduce the complexity of building, configuring, deploying, and measuring emulated networks. We present a system to facilitate emulation by providing translation from a high-level network design into a concrete set of configurations that are automatically deployed into one of several emulation platforms. Our system can be used to construct multi-domain networks in minutes, and is scalable to networks with over a thousand devices. It is modular, allowing support for different protocols, topology designs, and target platforms: Quagga, JunOS, IOS, etc. Users, from both the research community and industry, have already demonstrated its value in research and education.
Keywords: Emulation; Conguration Management
Rights: Copyright is held by the owner/author(s).
RMID: 0020134731
DOI: 10.1145/2535372.2535378
Appears in Collections:Electrical and Electronic Engineering publications

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