Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/85351
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Type: Journal article
Title: Nanometer thin-film Ni-NiO-Ni diodes for mixing 28 THz CO₂-laser emissions with difference frequencies up to 176 GHz
Other Titles: Nanometer thin-film Ni-NiO-Ni diodes for mixing 28 THz CO(2)-laser emissions with difference frequencies up to 176 GHz
Author: Fumeaux, C.
Herrmann, W.
Kneubuhl, F.K.
Rothuizen, H.
Lipphardt, B.
Weiss, C.O.
Citation: Applied Physics B: Lasers and Optics, 1998; 66(3):327-332
Publisher: Springer-Verlag
Issue Date: 1998
ISSN: 0721-7269
1432-0649
Statement of
Responsibility: 
C. Fumeaux, W. Herrmann, F.K. Kneubühl, H. Rothuizen, B. Lipphardt, C.O. Weiss
Abstract: For the first time we have demonstrated the mixing of two CO2-laser emissions near 28 THz (10.7 μm) with thin-film nanometer-scale Ni-NiO-Ni diodes (MOM, MIM) connected to integrated bow-tie antennas and integrated rhodium waveguides. Difference frequencies up to 176 GHz were observed in mixing processes up to the fifth order by the addition of microwaves generated by a Gunn oscillator. The frequencies reported are up to a factor of 30 higher than those reported previously for thin-film diodes. The current-voltage characteristics of the diodes measured at radio frequencies correspond to their nonlinearity at frequencies in the mid-infrared. The integrated bow-tie infrared antennas show almost perfect polarization with respect to the incident radiation. The ratio of the polarized versus the cross-polarized signal amplitudes is over 34 dB. These results signify the extension of millimeter-wave and microwave thin-film techniques to the infrared. © Springer-Verlag 1998.
Rights: © Springer-Verlag 1998
DOI: 10.1007/s003400050396
Published version: http://dx.doi.org/10.1007/s003400050396
Appears in Collections:Aurora harvest 2
Electrical and Electronic Engineering publications

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