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https://hdl.handle.net/2440/88680
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Type: | Book chapter |
Title: | Focused Ion Beam (FIB) technology for micro-and nanoscale fabrications |
Author: | Kant, K. Losic, D. |
Citation: | Lecture notes in nanoscale science and technology, 2013 / Zhiming AWaag, M., Salamo, G., Kishimoto, N., Bellucci, S., Park, Y. (ed./s), pp.1-22 |
Publisher: | Springer |
Publisher Place: | Switzerland |
Issue Date: | 2013 |
ISBN: | 9783319028736 |
Editor: | Zhiming AWaag, M. Salamo, G. Kishimoto, N. Bellucci, S. Park, Y. |
Statement of Responsibility: | Krishna Kant and Dusan Losic |
Keywords: | Focused ion beam; Micro- and nanofabrications; Ion milling; Deposition; Nanopore array |
Rights: | © Springer International Publishing Switzerland 2013 |
DOI: | 10.1007/978-3-319-02874-3_1 |
Published version: | http://dx.doi.org/10.1007/978-3-319-02874-3_1 |
Appears in Collections: | Aurora harvest 7 Chemical Engineering publications |
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