Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/62559
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Type: | Journal article |
Title: | Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry |
Author: | Murphy, Dominic F. Flavin, Donal A. |
Citation: | Applied Optics, 2000; 39(25):4607-4615 |
Issue Date: | 2000 |
School/Discipline: | School of Chemistry and Physics |
Statement of Responsibility: | Dominic F. Murphy and Dónal A. Flavin |
Rights: | © 2000 Optical Society of America |
DOI: | 10.1364/AO.39.004607 |
Appears in Collections: | IPAS publications |
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